Dr. Craig L. Johnson

Profile

Expert electron microscopist specialized in transmission electron microscopy and focused ion beam scanning electron microscopy and associated techniques. Extensive experience in solid-state chemistry, materials science, and mineralogy.

Education

• Ph.D., Arizona State University, Dept. of Chemistry & Biochemistry, 2004.
• B.S., Texas State University, Dept. of Chemistry, 1998. 

Professional Experience

Research Experience and Skills

• Transmission electron microscopy (TEM)
  • Quantitative high-resolution TEM : Nanoscale strain mapping in minerals and device materials
    
  • Electron Tomography: Nanoscale 3D characteriztion of materials
  • Microanalysis: energy dispersive spectroscopy and elemental mapping
• Focused Ion Beam Scanning Electron Microscopy: Device fabrication, 3D characterization and TEM lift-out sample preparation
  
• TEM Sample Preparation: Polishing, sectioning, ion milling, and ultramicrotomy 
• Scanning Electron Microscopy

Courses Taught

• Introduction to Nanocharacterization (TEM and FIB Components) – Drexel University
• Transmission Electron Microscopy – Drexel University
• Transmission Electron Microscopy Lab – Arizona State University
• First Year Chemistry Lab – Arizona State University

Awards and Recognitions

• 2010 - President's Award Nominee, Drexel University
• 2004 - Best Student Poster Award from the Arizona Imaging Society
• 2003 - Presidential Student Award from the Microscopy Society of America

Synergistic Activities

• Organized Applications of Microscopy in Materials Science and Biology Symposium, Drexel University, Fall 2010
• Organized Current Trends in Electron Microscopy and Microanalysis Symposium, Drexel University, Spring 2010
• Member of the Microscopy Society of America
• Member of Philadelphia Society for Microscopy
• Referee of papers submitted to Microscopy and Microanalysis and American Mineralogist
• Reviewer of proposals submitted to the National Science Foundation

Selected Publications

Johnson, S.H., Johnson, C.L., May, S.J., Hirsch, S.J., Cole, M.W. and Spanier, J.E. (2010) Co@CoO@Au core-multi-shell nanocrystals. Journal of Materials Chemistry, 20, 439-443.

Nonnenmann, S.S., Gallo, E.M., Coster, M.T., Soja, G.R., Johnson, C.L., Joseph, R.S. and Spanier, J.E. (2009) Piezoresponse through a ferroelectric nanotube wall. Applied Physics Letters, 95, 232903.

Johnson, C.L., Bording, J.K. and Zhu, Y. (2008) Structural inhomogeneity and twinning in YBa₂Cu₃O_7-d: High-resolution transmission electron microscopy measurements. Physical Review B, 78, 014517.

Johnson, C.L., Snoeck, E., Ezcurdia, M., Rodríguez-González, B., Pastoriza-Santos, I., Liz-Marzán, L.M., and Hÿtch, M.J. (2008) Effects of elastic anisotropy on strain distributions in decahedral gold nanoparticles. Nature Materials, 7, 120-124 and cover photograph.

Klie, R.F., Johnson, C.L., and Zhu, Y. (2008) Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS. Microscopy and Microanalysis, Special Issue on Aberration-Corrected Electron Microscopy, 14, 104-112 and cover photograph.

Hüe, F., Johnson, C.L., Lartigue-Korinek, S., Wang, G., Buseck, P.R., and Hÿtch, M.J. (2005) Calibration of projector lens distortions. Journal of Electron Microscopy-Special Issue Dedicated to the Memory of John M. Cowley, 54, 181-190.

Johnson, C.L., Hÿtch, M.J., and Buseck, P.R. (2004) Nanoscale waviness of low-angle grain boundaries. Proceedings of the National Academy of Sciences - USA, 101, 17936-17939 and cover photograph.

Johnson, C.L., Hÿtch, M.J., and Buseck, P.R. (2004) Displacement and strain fields around a [100] dislocation in olivine measured to sub-Ångstrom accuracy. American Mineralogist, 89, 1374-1379.