CENTRALIZED RESEARCH FACILITIES (CRF)

College of Engineering

Drexel University

The former Materials Characterization Facility (MCF) and Microfabrication Facility (MFF) have been reorganized under the banner of the Centralized Research Facilities (CRF) of the College of Engineering.

Starting from January 1, 2008 there will be new user fee policy and rate schedules based on a paid subscription for using CRF instruments for a user selected period of time. The new CRF rates and fees can be seen here:

In order to use the CRF instruments after January 1, 2008, every user (Drexel student/researcher or External academic/ company researcher) must fill in and sign a subscription access form and submit it to the respective CRF manager. The CRF access forms can be downloaded here:

More information will be posted in our new webpage which is under development.


POSITION OPEN: Electron Microscopy Scientist

Click for more information

Compulsory radiation monitoring badges for XRD and SEM work

For all users of the SEM or XRD equipment, the Radiation Worker Registration Form must be filled out and returned to Andrew Giagnacova, (Fax: 215 762-1608, email: Andrew.G.Giagnacova@drexel.edu, Phone: 215-762-6494) or mailed to: Andrew Giagnacova, Radiation Safety, Mail Stop 106, 245 North 15th Street, Philadelphia, PA 19102-1192.


Materials Characterization Equipment

FEI ESEM FEI XL30 Environmental SEM with EDS and EBSD

Major Features

Zeiss FESEM Zeiss Supra 50VP Scanning Electron Microscope with EDS and WDS

ZEISS´s unique variable pressure technology makes the ZEISS SUPRA 50VP the most versatile analytical FESEM currently available. The ZEISS SUPRA 50VP allows simultaneous EDS and WDS in high vacuum mode. The variable pressure mode adds the advantage of analysing insulating specimens. The short working distance allows simultaneous acquisition of EDS, WDS, SE, BSD, CL and specimen current signals. The extended performance of the GEMINI column delivers ample beam current for the most demanding WDS analysis.

Important Features

Amray SEM Amray 1830 Scanning Electron Microscope with Zyvex Nanomanipulator

Important Features

Amray 1830

S100 Nanomanipulator System

Visible Raman Renishaw RM1000 VIS Raman Microspectrometer with 514.5, 633 and 785 nm Excitation

Important Features

UV Raman Renishaw RM2000 UV Raman Microspectrometer with 244, 325 and 488 nm Excitation

Important Features

Siemens XRD Siemens D500 X-Ray Powder Diffractometer (XRD)

Important Features

Opticalmicroscope Olympus Metallographic Optical Microscope

MicroFTIR Varian Excalibur FTS-3000 and UMA-600 FTIR Microspectrometer with ATR and Reflection Accessories

Important Features

Nano-Indenter MTS Nanoindenter XP

Important Features

Micro-Hardness Tester Micro-Hardness Tester

Important Features

Microfabrication Equipment

STS ICP DRIE STS (Surface Technology System) Inductive Coupled Plasma (ICP) Deep Reactive Ion Etching (DRIE)

Important Features

BOC Edwards A306 E-beam Evaporator BOC Edwards A306 E-beam Evaporator

Important Features

Karl Suss MJB-3 Mask Aligner Karl Suss MJB-3 Mask Aligner

Important Features

Zygo NewView 6000 Optical Profiler Zygo NewView 6000 Optical Profiler

Important Features

Other