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Dr. Dmitri Barbash

Profile

•Exceptional knowledge of XPS technique and instrumentation.

•Strong troubleshooting and operational skills to surface and near-surface spectroscopy instruments including but not limited to XPS, XRD, ATR-FTIR, ToF-SIMS.

Education

PhD Degree in Analytical Chemistry
University of New Mexico, Albuquerque, NM.
Concentration on surface analysis techniques. GPA 4.0

2003-2006

Started Graduate Program in Chemistry
Kent State University, Kent, OH.
Concentration in Analytical Chemistry. Completed Graduate level Course requirements. GPA 3.52

2000-2003

B.S. Degree in Chemistry
National Technical University of Ukraine, NTUU-KPI, Kiev, Ukraine. Completed with honor.

1995-2000

Professional Experience

Field Engineer, Physical Electronics, PHI-USA 

2006-2012

Installation of the new PHI equipment, complete maintenance, in depth troubleshooting to the board level. XPS optics diagnostic and repair.  Filament replacement in X-Ray gun, Argon and C60 ion gun ionizer change, cathode replacement in neutralizer. Spectroscopic turning of the XPS and ToF-SIMS instruments, sensitivity and linearity calibration, pass energy and dynamic tracking, ion gun and neutralizer alignment. Ultra-high vacuum troubleshooting and helium leak detection. Complete understanding of the electronic signal flow during data acquisition with voltage analysis for PHI VersaProbe and Quantum/Quantera XPS lines. Completed more than 100 service calls, performed 6 instrument installations for the customers such as Johnson&Johnson, WLGore, AirProdicts/Intertek, DuPont, DePuy, Ford, SUNY, Corning.  Installed first Ultra Violet Photoelectron Spectroscopy (UPS) option for VersaProbe line in US.

 

Research and Teaching Assistant, Center for Micro-Engineered Materials (CMEM) at University of New Mexico (UNM)

2003-2006

Material characterization using surface sensitive techniques: X-Ray Photoelectron Spectroscopy (XPS), Time of Flight Secondary Mass Spectrometry (ToF-SIMS). Primary focus is in XPS surface sensitive technique. Investigation of surface elemental composition from survey and high resolution spectra. Understanding of chemical composition from high resolution spectra by curve fit analysis and evaluation of the chemical environment of the elements based on data deconvolution. XPS elemental destructive depth profiles by Ar ion gun as well as C60. Mapping and chemical identification of the regions and elements associated with those regions. Understanding of the neutralization issues during XPS analysis, application of proper neutralization methods for polymers and others non-conducting samples. Identification and classification of the polymers by “signature” regions of valence bands acquired with XPS and UPS techniques. Hot and cold stage operation during XPS analysis for catalysis and biological samples.

Data Analysis. Conventional XPS data analysis through acquisition of survey and high resolution spectra and data analysis by multivariate analysis methods, such as factor analysis and principal component analysis.

Biological Skills. Single stranded DNA and protein immobilization on the solid substrates utilizing various surface chemistry deposition techniques.

Instrumental Support and maintenance for Kratos AxisUltra XPS, provided complete data analysis and delivered service reports for internal and external customers of UNM.

 

Publications

D.Barbash, J.Wu, LA Fenton, J Fulghum. A Novel Imaging Technique to Investigate the Influence of Atomization Air Pressure on Film-Tablet Interfacial Thickness. Drug Development and Industrial Pharmacy, 1520-5762, Volume 35, Issue 4, 2009, 480-486.

Vanchura BA, He P, Antochshuk V, Jaroniec M, Ferryman A, Barbash D, Fulghum JE, Huang SD., Direct Synthesis of Mesostructured Lamellar Molybdenum Disulfides Using a Molten Neutral n-Alkylamine as Solvent and Template. J.Am.Chem.Soc. 2002, 124, 12090-12091.

Presentations

Oral presentation “Effect of powder gas on low pressure plasma sprayed yttria coatings” International Thermal Spray Conference and Exposition (ITCE). 

2006

Poster presentation  “Characterization of dNTPs and ssDNA attached to diazonium modified surfaces”.

2005

Poster presentationAn Influence of atomization air pressure used during the coating processes on film-tablet interface thickness”.  American Association of Pharmaceutical Scientists (AAPS).

2004

Oral presentation “Characterization of bound nucleotides using XPS and ATR-FTIR”. AVC. Anaheim, CA.

2004

Poster presentation “Characterization of DNA microarrays. AVC. Baltimore, MD.

2003

Poster presentation “Identification of chemical components in XPS spectra and images using multivariate statistical analysis methods”. AVC.  San Francisco, CA.

2001

Certifications

ICDD (International Center for Diffraction Data) Advanced Rietveld Refinement & Indexing Workshop    09/29-10/03 2013 

ICDD X-RAY CLINIC “Fundamentals of X-ray Powder Diffraction”  06/03-06/07 2013

AVS  Course “X-ray Photoectron Spectroscopy” 05/22-05/24 2005

AVS Training “Materials and Surface Microcharacterization and Analysis” 12/02-12/03 2003

AVS  Training “Operation and Maintenance of Vacuum Pumping Systems”11/03-11/04 2003

Personal Interests

USA cycling Category 3 (Cat3) license. Quaker City Wheelman  “Road rider of the year award”. 2008

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