X-Ray Diffractometer (Rigaku SmartLab)
Contact: Dmitri Barbash
Cross Beam Shaping Optics (CBO) with Parabolic Mirror:
User selectable Parallel Beam and Bragg-Brentano optical configurations for asymmetric and symmetric scanning geometries.
Parallel Beam Optics
• Incident beam parabolic multilayer x-ray mirror compatible
with all Parallel Beam optics including Ge channel-cut optics.
• Automated mirror control and alignment.
• CBO Selection Slit: Parallel Beam
• Variable Incident Slit: 0.05 – 7.0 mm, 0.01 mm step
• Height Limiting Slit: 2.0, 5.0, 10.0, and 15 mm
• CBO Selection Slit: Bragg-Brentano
• Variable Divergence Slit: 0.05 – 7.0 mm, 0.01 mm step
• Height Limiting Slit: 2.0, 5.0, 10.0 mm
• Soller Slits: 0.5° axial divergence
Ge (220) 2-Bounce and 4-Bounce Incident Beam Monochromators
High-resolution channel-cut incident beam monochromators for high-resolution parallel beam measurements
of the crystal structure of highly perfect epitaxial materials.
SmartLab High-Resolution Vertical θ/θ Goniometer
High-resolution vertical theta-theta goniometer system with open architecture design for horizontal sample mounting and measurement.
• High-precision, vertical theta/theta geometry (horizontal sample)
• Optical encoder controlled
• Fully automated alignment
• Independently controlled theta (source) and theta (detector) axes
• Measuring range: -3 – 160° (2 theta)
• Scanning speed: 0.01°/min - 20°/min (theta)
• Scanning Method: theta(source)/theta (detector), independent or coupled
High Precision Motor driven Z-Stage for Horizontal Sample Measurement: Z = -10 ~ 1 mm / 0.0005 mm step
100mm XY Sample Stage: mounts directly on the SmartLab high precision Z-stage with no alignment. XY mapping is possible over entire 100mm sample surface size.
• X,Y: ± 50 mm / 0.0005 mm step
• Sample Size: 200 mm φ (8” φ) diameter maximum
• XY Mapping: 100 mm φ (4” φ) diameter area
Domed Hot Stage for high temperature analysis of thin samples
• Operating temperature: Room temperature to 1100 °C
• Temperature measurement: Pt−Pt10Rh (type S) thermocouple
• Atmospheres: Vacuum, air, inert gas
• Maximum operating pressure: 0.2 to 0.3 bar above atmospheric pressure
• Total transmission: CuKα 65% (primary and diffracted beam)
In-Plane Diffraction Attachment
The in-plane diffraction attachment provides an additional detector scanning axis orthogonal to the theta/2-theta diffraction plane. Allows measurement of in-plane structure factors from epitaxial films, in-plane reciprocal space maps from ultra thin (a few nm) films, and full pole figures
Rx,Ry Direct Connect Tilt Stage: Two-axis tilt stage for in-plane alignment
• Rх Tilt Rotation: -5.0 – 5.0°, 0.002° step
• Ry Tilt Rotation: -5.0 – 5.0°, 0.002° step
Phi Attachment for In-plane Sample Rotation
In-plane sample rotation axis for in-plane alignment and in-plane texture analysis.
• Phi rotation: 360° free rotation, 0.002° step
• Step or continuous rotation of sample.
Diffracted Beam Optics
Diffracted Beam Optics Assembly
Modular beam path suitable for a wide range of diffracted beam optical configurations including parallel slit analyzers and Ge analyzer crystals, and dual receiving slits.
• Receiving Slit 1: Computer-Controlled, 0.05 mm - 20 mm, 0.01 mm step
• Parallel Slit Analyzer: 0.5° Angular Divergence
• Receiving Slit 2: Computer-Controlled, 0.05 mm - 20 mm, 0.01 mm step
• Kβ Filter: Nickel for Cu Radiation
• Attenuator: Computer-Controlled, Four attenuators included with different absorption rates
Curved & Flat Diffracted Beam Monochromator
Graphite crystal monochromator with unique design, allows use with either Bragg-Brentano or Parallel Beam optics. A simple 90° rotation of the crystal changes the surface from curved (Bragg-Brentano) to flat (Parallel Beam), or vice-versa, without realignment and without removing the monochromator from the system. This monochromator provides discrimination of CuKβ,W-L radiation, and fluorescent X-rays.
High-efficiency scintillation counter and measuring electronics provide 700,000 cps or better linearity; Computer controlled pulse-height analyzer (PHA) and detector high-voltage settings; Computer-Controlled and Automated Dead time correction.