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Transmission Electron Microscopy
Transmission Electron Microscope (JEOL JEM2100)
Contact: Craig Johnson
Important Features
- 200 keV TEM/STEM equipped with LaB6 electron gun, EDS detector for chemical analysis, bright-field STEM detector and imaging system, and high-resolution objective-lens pole piece
- Capable of < 0.2 nm high-resolution imaging, nano-beam and convergent-beam electron diffraction, and EDS compositional mapping
- Computer-controlled operation using intuitive and easy to use MS Windows™ based software
- Specimen holders include single and double tilt, high-tilt tomography, biasing, and heating
- TEM sample-preparation equipment available: ion mill, jet electropolisher, cryo-ultramicrotome, and other sample sectioning, grinding and polishing equipment
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