Scanning Electron Microscopy

Scanning Electron Microscope (Zeiss Supra 50VP) with EDS

Contact: Edward Basgall

Important Features

• Schottky Field Emission Electron Gun
• Everhart-Thornley and In-Lens Secondary and Solid State Backscatter Imaging Detectors
• High Vacuum, Variable Pressure, and High Current Modes
• Simultaneous acquisition of EDS, SE, BSD, and specimen current signals
• Oxford Energy-Dispersive X-ray Microanalysis
• IR Chamber View

Environmental SEM (FEI XL30) with EDS and EBSD

Contact: Edward Basgall

Important Features

• Schottky Field Emission Gun
• Everhart-Thornley Secondary, Gaseuos Secondary and Solid State Backscatter Imaging
• High Vacuum, Variable Pressure, and Wet modes
• Peltier cooling stage
• EDAX Energy-Dispersive X-ray Microanalysis
• TSL Electron Back Scattered Diffraction (crystallography)
• IR Chamber View