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Scanning Electron Microscopy
Scanning Electron Microscope (Zeiss Supra 50VP) with EDS
Important Features
- Schottky Field Emission Electron Gun
- Everhart-Thornley and In-Lens Secondary and Solid State Backscatter Imaging Detectors
- High Vacuum, Variable Pressure, and High Current Modes
- Simultaneous acquisition of EDS, SE, BSD, and specimen current signals
- Oxford Energy-Dispersive X-ray Microanalysis
- IR Chamber View
Environmental SEM (FEI XL30) with EDS and EBSD
Important Features
- Schottky Field Emission Gun
- Everhart-Thornley Secondary, Gaseuos Secondary and Solid State Backscatter Imaging
- High Vacuum, Variable Pressure, and Wet modes
- Peltier cooling stage
- EDAX Energy-Dispersive X-ray Microanalysis
- TSL Electron Back Scattered Diffraction (crystallography)
- IR Chamber View
Dual Beam Focused Ion Beam - SEM (FEI Strata DB235)
Important Features
- Site specific precision ion milling and metal deposition for 3D nanomachining, materials characterization, nanopatterning and nanofabrication.
- High brightness gallium ion beam
- Gas injection systems for platinum and insulator deposition
- Secondary electron and secondary ion imaging
- High-resolution in-lens secondary electron detector
- Omniprobe in-situ micromanipulator for preparation and manipulation (lift-out) of TEM samples
- Integrated X-ray fluorescence analyzer with a separate X-ray source providing high sensitivity for trace analysis of elemental composition (IXRF)
- Energy dispersive X-ray analysis (EDS) with e-beam
- Combined XRF-EDS spectral and mapping capabilities
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