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Scanning Electron Microscopy

Scanning Electron Microscope (Zeiss Supra 50VP) with EDS

Contact: Edward Basgall

 

Important Features

  • Schottky Field Emission Electron Gun
  • Everhart-Thornley and In-Lens Secondary and Solid State Backscatter Imaging Detectors
  • High Vacuum, Variable Pressure, and High Current Modes
  • Simultaneous acquisition of EDS, SE, BSD, and specimen current signals
  • Oxford Energy-Dispersive X-ray Microanalysis
  • IR Chamber View

Environmental SEM (FEI XL30) with EDS and EBSD

Contact: Edward Basgall

 

Important Features

  • Schottky Field Emission Gun
  • Everhart-Thornley Secondary, Gaseuos Secondary and Solid State Backscatter Imaging
  • High Vacuum, Variable Pressure, and Wet modes
  • Peltier cooling stage
  • EDAX Energy-Dispersive X-ray Microanalysis
  • TSL Electron Back Scattered Diffraction (crystallography)
  • IR Chamber View
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