Instruments Available through the CRF

X-Ray Photoelectron Spectroscopy (XPS) with Auger  

• XPS and AES Spectrometer (Physical Electronics VersaProbe 5000)

Vibrational Spectroscopy

• VIS Raman Microspectrometer (Renishaw RM1000)
• UV Raman Microspectrometer (Renishaw RM2000)
• FTIR Spectrometer with Microscope (Varian Excalibur FTS-3000)

Ultrafast Spectroscopy

• Femtosecond Visible Transient Absorption Spectrometer (Ultrafast Systems Helios)
• Time-Resolved Terahertz Spectrometer

Scanning Electron Microscopy

• Scanning Electron Microscope (Zeiss Supra 50VP) with EDS (Oxford)
• Environmental Scanning Electron Microscope (FEI XL30) with EDS (EDAX) and EBSD (TSL)

Transmission Electron Microscopy

• Transmission Electron Microscope (JEOL JEM2100)

Focused Ion Beam

• Dual Beam Focused Ion Beam - SEM (FEI Strata DB235)

X-Ray Diffraction

• X-Ray Diffractometer (Rigaku SmartLab)
• X-Ray Diffraction Database (JADE 7.0, MDI, Inc)

Small/Wide Angle X-Ray Scattering (SAXS/WAXS)

• Small/Wide Angle X-Ray Scattering (SAXS/WAXS) (Rigaku S-MAX 3000)

Micro Computed Tomography (MicroCT)

• Micro Computed Tomography System (MicroCT) (Skyscan 1172)

Nanoindentation

• Nanoindenter XP with CSM (MTS)

Microfabrication

• ICP Deep Reactive Ion Etching (STS)
• E-beam Evaporator (BOC Edwards A306)
• Thermal Evaporator (Thermionics VE 90)
• Optical Profiler (Zygo NewView 6000)
• Mask Aligner (Karl Zuss MJB-3)
• Laser Ablation System (Resonetics RapidX 250 Workstation)

Sample Preparation