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Instruments Available through the Core Facilities

X-Ray Photoelectron Spectroscopy (XPS) with Auger  

  • XPS and AES Spectrometer (Physical Electronics VersaProbe 5000)

Ultrafast Spectroscopy

  • Femtosecond Visible Transient Absorption Spectrometer (Ultrafast Systems Helios)
  • Time-Resolved Terahertz Spectrometer

Scanning Electron Microscopy

  • Scanning Electron Microscope (Zeiss Supra 50VP) with EDS (Oxford)
  • Environmental Scanning Electron Microscope (FEI XL30) with EDS (EDAX) and EBSD (TSL)

Transmission Electron Microscopy

  • Transmission Electron Microscope (JEOL JEM2100)

Focused Ion Beam

  • Dual Beam Focused Ion Beam - SEM (FEI Strata DB235)

X-Ray Diffraction

  • X-Ray Diffractometer (Rigaku SmartLab)
  • X-Ray Diffraction Database (JADE 7.0, MDI, Inc)

Small/Wide Angle X-Ray Scattering (SAXS/WAXS)

  • Small/Wide Angle X-Ray Scattering (SAXS/WAXS) (Rigaku S-MAX 3000)


  • Nanoindenter XP with CSM (MTS)


  • Thermal Evaporator (Thermionics VE 90)
  • Carver Heated Press

Sample Preparation

  • Fischione 1010 Low Angle Ion Mill
  • Optical Microscopes
  • Cutting and polishing tools


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