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Drexel University’s Centralized Research Facilities
along with FEI, EDAX and TMC present...

Current Trends in Electron
Microscopy and Microanalysis

April 14, 2010

Drexel University, Bossone Research Enterprise Center
3126 Market Street, Philadelphia, PA

Agenda

8:30 am Registration and Coffee
Morning Session Chair: Dr. Edward Basgall, CRF Drexel
9:00 am Introduction/Greetings
Dr. Frank Ferrone, Associate Vice Provost for Research, Drexel University
9:10 am Latest Advances in Analytical and High-Resolution TEM/STEM
Dr. Jan Ringnalda, FEI
9:40 am Measuring and cancelling stray magnetic fields for SEMs and TEMs
Bill Reid, TMC
10:10 am Coffee Break
10:30 am Phase Mapping for Energy Dispersive Spectroscopy: The Future of X-ray Mapping
Tara Nylese, EDAX
11:00 am Controlling floor vibration and its effect on high resolution electron microscopy
Bill Reid, TMC
11:30 am Nanocharacterization in the Centralized Research Facilities at Drexel University
Dr. Zhorro Nikolov, CRF Drexel
Noon Complimentary Lunch
1:00 pm CRF Lab Tours
Afternoon Session Chair: Dr. Craig Johnson, CRF Drexel
2:00 pm Latest Advances in Focused Ion Beam and Extreme Resolution Scanning Electron Microscopy
Dr. Lucille Giannuzzi, FEI
2:30 pm On direct-writing methods for electrically contacting semiconductor and functional oxide nanowires
Dr. Jonathan Spanier, Drexel University
3:00 pm Coffee Break
3:20 pm Characterizing Thin-Film Photovoltaics with Electron Back-Scattered Diffraction
Tara Nylese, EDAX
3:50 pm Lights, Camera, Action: A Look into the Development and Applications of Ultrafast In Situ TEM
Dr. Mitra Taheri, Drexel University

 

Registration for the seminar is free and complimentary coffee and lunch will be provided. Free parking will be available to pre-registered guests.  Please register by March 31.  Space is limited.  For more information, please contact Craig Johnson at (215) 895-5900 or cljohnson [at] coe.drexel.edu.

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